Aluminum Electrode Insulation Dynamics via Interface Oxidation by Reactant Diffusion in Organic Layers-Reference-Cited by-同舟云学术

Aluminum Electrode Insulation Dynamics via Interface Oxidation by Reactant Diffusion in Organic Layers

Published:2018-08-26 Issue:23 Volume:215 Page:1800474
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Fluhr Daniel¹²³^ORCID,Züfle Simon⁴⁵,Muhsin Burhan¹²,Öttking Rolf¹²⁶,Seeland Marco³⁷,Roesch Roland¹²,Schubert Ulrich S.¹²,Ruhstaller Beat⁴⁵,Krischok Stefan³,Hoppe Harald¹²

Affiliation:

1. Center for Energy and Environmental Chemistry Jena (CEEC Jena), Friedrich Schiller University Jena; 07743 Jena Germany

2. Laboratory of Organic and Macromolecular Chemistry (IOMC), Friedrich Schiller University Jena; 07743 Jena Germany

3. Institute of Physics, Technische Universität Ilmenau; 98693 Ilmenau Germany

4. Institute of Computational Physics, Zurich University of Applied Sciences (ZHAW); 8401 Winterthur Switzerland

5. Fluxim AG; 8400 Winterthur Switzerland

6. AQComputare; Gesellschaft für Materialberechnung mbH; Annaberger Straße 240 D-09125 Chemnitz Germany

7. Institute for Computer and Systems Engineering, Technische Universität Ilmenau; 98693 Ilmenau Germany

Funder

Federal Ministry of Education and Research

Thüringer Ministerium für Bildung, Wissenschaft und Kultur

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201800474/fullpdf

Reference31 articles.

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