Thermal Effects on the Hydrogen Passivation of Silicon Wafers During Diode Laser Annealing-Reference-Cited by-同舟云学术

Thermal Effects on the Hydrogen Passivation of Silicon Wafers During Diode Laser Annealing

Published:2018-04-17 Issue:11 Volume:215 Page:1800060
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Ahmmed Mohammad Shakil¹,Song Lihui²,Huda Nazmul³

Affiliation:

1. School of Mechanical & Manufacturing Engineering/School of Photovoltaic & Renewable Energy Engineering, UNSW Sydney; NSW-2052 Australia

2. College of Materials and Environmental Engineering, Hangzhou Dianzi University; Hangzhou 310018 P. R. China

3. Sustainable Energy Systems Engineering Research Group, School of Engineering, Macquarie University; Sydney NSW-2109 Australia

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. Buried contact silicon solar cells

2. Optical and electrical properties of laser texturing for high-efficiency solar cells

3. Selective laser ablation of SiNxlayers on textured surfaces for low temperature front side metallizations

4. Fundamentals of Laser-Material Interaction and Application to Multiscale Surface Modification

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