Resistivity transients in solution-processed transparent ZnO thin films as a function of UV illumination wavelength-Reference-Cited by-同舟云学术

Resistivity transients in solution-processed transparent ZnO thin films as a function of UV illumination wavelength

Published:2017-03-22 Issue:6 Volume:214 Page:1600853
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Fuchs Peter¹,Steinhauser Jérôme¹,Romanyuk Yaroslav E.¹,Tiwari Ayodhya N.¹

Affiliation:

1. Laboratory for Thin Films and Photovoltaics; Empa; Swiss Federal Laboratories for Materials Science and Technology; Ueberlandstrasse 129 8600 Duebendorf Switzerland

Funder

Bundesamt für Energie

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201600853/fullpdf

Reference19 articles.

1. Electronic Processes in Zinc Oxide

2. Adsorption, desorption and conductivity of sputtered zinc oxide thin films

3. Photoinduced oxygen release and persistent photoconductivity in ZnO nanowires

4. An aqueous solution process and subsequent UV treatment for highly transparent conductive ZnO films

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