Analysis of Die Compaction of Chip Geometry through Porous Continuum Model‐Based Approach

Author:

Lee Jeong Ah1,Kwon Jihye1,Kwon Gihyeok2,Hong Soon Jik3,Kim Hyoung Seop1456ORCID

Affiliation:

1. Department of Materials Science and Engineering Pohang University of Science and Technology (POSTECH) Pohang 37673 Republic of Korea

2. Department of Materials and Processing Research Laboratory Research Institute of Industrial Science & Technology Pohang 37673 Republic of Korea

3. Division of Advanced Materials Engineering & Center for Advanced Materials and Parts of Powder (CAMP2) Kongju National University Cheonan 31080 Republic of Korea

4. Graduate Institute of Ferrous & Energy Materials Technology Pohang University of Science and Technology Pohang 37673 Republic of Korea

5. Institute for Convergence Research and Education in Advanced Technology Yonsei University Seoul 03722 South Korea

6. Advanced Institute for Materials Research (WPI-AIMR) Tohoku University Sendai 980-8577 Japan

Abstract

Metal swarf has the advantage of being eco‐friendly due to their ability to be recycled and reused, in addition to being lightweight, energy‐absorbing, and cost‐effective. For practical applications in various industrial fields, effective and accurate modeling for each case should be developed in consideration of its physical properties. This study investigates the mechanical behavior of aluminum chip compaction employing a new computational simulation approach based on a pressure‐dependent porous continuum model. Two material parameters of densification rate (n) and the ratio of shear modulus (m) are proposed and adjusted for different swarf. The numerical results show good agreement with the experimentally obtained axial stress—relative density relation of three various samples, demonstrating a close relationship between the parameters n and the chip geometry. This study can be applied for further investigation and analysis utilizing metal swarf of different geometries in various industrial applications.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

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