Ex Situ Residual Stress Analysis of Chemical Vapor Deposited Diamond Coated Cutting Tools by Synchrotron X‐Ray Diffraction in Transmission Geometry-Reference-Cited by-同舟云学术

Ex Situ Residual Stress Analysis of Chemical Vapor Deposited Diamond Coated Cutting Tools by Synchrotron X‐Ray Diffraction in Transmission Geometry

Author:

Hinzmann Daniel¹^ORCID,Böttcher Katrin²,Reimers Walter²,Uhlmann Eckart¹³

Affiliation:

1. Institute for Machine Tools and Factory Management (IWF) Technische Universität Berlin Pascalstr. 8-9 10587 Berlin Germany

2. Institute for Materials Science and Technology Metallic Materials Technische Universität Berlin Ernst-Reuter-Platz 1 10587 Berlin Germany

3. Department of Production Systems Fraunhofer Institute for Production Systems and Design Technology (IPK) Pascalstr. 8-9 10587 Berlin Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

Reference59 articles.

2. F.Sammler Doctoral Thesis Technische Universität Berlin 2015.

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