Green deep‐UV photoresist based on chitosan for microelectronics

Author:

Sysova Olha12,Durin Paule34,Gablin Corinne4,Léonard Didier4,Téolis Alexandre5,Trombotto Stéphane5,Delair Thierry5,Berling Dominique12,Servin Isabelle6,Tiron Raluca6,Bazin Arnaud6,Leclercq Jean‐Louis3,Chevolot Yann3,Soppera Olivier12ORCID

Affiliation:

1. Université de Haute‐Alsace, CNRS, IS2M UMR 7361 Mulhouse France

2. Université de Strasbourg Strasbourg France

3. Université de Lyon, CNRS, INSA Lyon, Ecole Centrale de Lyon, Université Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270 Ecully Cedex France

4. Université de Lyon, CNRS, Université Claude Bernard Lyon 1, Institut des Sciences Analytiques, UMR 5280 Villeurbanne France

5. Université de Lyon, CNRS, UMR 5223, Ingénierie des Matériaux Polymères, Université Claude Bernard Lyon 1, INSA Lyon, Université Jean Monnet Villeurbanne Cedex France

6. Université Grenoble Alpes, CEA, LETI Grenoble France

Abstract

AbstractPhotolithography is a core part in microelectronic processes. This technological step implies the use of numerous hazardous carcinogenic compounds in the  formulations, the use of solvents for processing synthetic polymers to obtain micro and nanostructures. We proposed the use of chitosan‐based biosourced water‐soluble resins to significantly reduce the environmental impact of the photolithography step, for 193 nm photolithography. We show in this report that chitosan‐based photoresist is suitable for microelectronic application, and in particular, we could significantly improve photosensitivity by adding a water‐soluble photoacid generator (PAG). UV–visible and Fourier transform infrared‐attenuated total reflectance characterizations reveal an increase of the macromolecular chain scission kinetics in the presence of PAG. Moreover, the local decrease of the pH favors the solubility of chitosan in irradiated areas. Finally, the photolithography tests demonstrate that the dose to clear and the optimal dose for photopatterning are divided by a factor of two. Moreover, the physical etching transfer tests show that the presence of PAG does not decrease the transfer performance, making these aqueous‐based formulated resins still more adapted for the fabrication of microelectronic devices.

Funder

Agence Nationale de la Recherche

Publisher

Wiley

Subject

Materials Chemistry,Polymers and Plastics,Surfaces, Coatings and Films,General Chemistry

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