Resolution enhancement of x‐ray photoelectron spectra by maximum entropy deconvolution-Reference-Cited by-同舟云学术

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Resolution enhancement of x‐ray photoelectron spectra by maximum entropy deconvolution

Published:1998-03 Issue:3 Volume:26 Page:195-203
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Splinter S. J.¹,McIntyre N. S.¹

Affiliation:

1. Surface Science Western, The University of Western Ontario, London, Ontario N6A 5B7, Canada

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/%28SICI%291096-9918%28199803%2926%3A3%3C195%3A%3AAID-SIA364%3E3.0.CO%3B2-%23

Reference60 articles.

1. Correction of distortions in spectral line profiles: Applications to electron spectroscopies

2. The application of deconvolution methods in electron spectroscopy — a review

3. Correction for loss effects in valence‐band XPS spectra by deconvolution

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2. Decoding ‘Maximum Entropy’ Deconvolution;Entropy;2022-09-02

3. Maximum-entropy revisited: Optimal filtering of spectra;Journal of Applied Physics;2021-06-14

4. Nanostructure of Surface Films on Ni18P Alloy in Sulfate Solutions by the Maximum Entropy Method;ACS Omega;2017-11-10

5. An algorithm for removing charging effects from X-ray photoelectron spectra of nanoscaled non-conductive materials;Journal of Electron Spectroscopy and Related Phenomena;2015-07

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