Simplified equations for correction parameters for elastic scattering effects in AES and XPS forQ, ? and attenuation lengths
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference27 articles.
1. Database of correction parameters for the elastic scattering effects in XPS
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3. Effect of the analyser acceptance angle on the photoelectron intensity
4. Matrix dependence of elastic scattering effects in quantitative AES and XPS
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