Temperature dependent cut‐resistance properties of ultra‐high molecular weight polyethylene based knitted textiles

Author:

Singh Shubham1,Somkuwar Viraj Uttamrao1,Maurya Sandeep Kumar1,Garg Hema1,Das Apurba1,Kumar Nandan2,Kumar Bipin1ORCID

Affiliation:

1. Department of Textile and Fibre Engineering Indian Institute of Technology New Delhi Delhi India

2. High Performance Textiles Pvt. Ltd. Panipat Haryana India

Abstract

AbstractThe increasing awareness of safety standards for personal protective equipment in various industries and everyday life has significantly increased the demand for effective cut‐resistance clothing to prevent injuries. Ultra‐high molecular weight polyethylene (UHMWPE), renowned for its strength, is predominantly used to produce cut‐protective clothing for sectors such as automotive, manufacturing, glass, and metal. These cut‐resistance clothing are often exposed to harsh workplace conditions, including elevated temperatures, which can compromise their structural integrity and diminish their cut‐protection efficacy. The present work investigates the effect of temperature on the cut‐resistance performance of core‐spun UHMWPE yarns integrated with stainless‐steel and glass filament‐based knitted fabrics. Cut‐performance was assessed across industrial work handling temperatures ranging from 30 to 75°C. Furthermore, thermal cut performance was analyzed by structural characterization and surface morphology of the samples. The results revealed a general decline in cut performance with increasing temperature for all samples, with stainless steel‐reinforced UHMWPE fabrics experiencing the most pronounced reduction % compared with their glass fiber‐reinforced and 100% UHMWPE counterparts. These results are substantiated by analyses of surface temperature distribution profiles and x‐ray diffraction outcomes. This study benefits industry workers, guiding them in selecting effective protective clothing for varied thermal conditions.

Funder

Ministry of Textiles, Government of India

Publisher

Wiley

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