Depth profiling of anodic tantalum oxide films with gold cluster ions
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.3441/fullpdf
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1. Secondary ion mass spectrometry using cluster primary ion beams
2. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
3. Depth Profiling of Peptide Films with TOF-SIMS and a C60 Probe
4. TOF-SIMS 3D Biomolecular Imaging of Xenopus laevis Oocytes Using Buckminsterfullerene (C60) Primary Ions
5. Depth Profiling Brain Tissue Sections with a 40 keV C60+ Primary Ion Beam
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