Grazing‐Incidence Texture Tomography and Diffuse Reflectivity Tomography of an Organic Semiconductor Device Array**-Reference-Cited by-同舟云学术

Grazing‐Incidence Texture Tomography and Diffuse Reflectivity Tomography of an Organic Semiconductor Device Array**

Published:2022-06-23 Issue:11 Volume:2 Page:
ISSN:2628-9725
Container-title:Chemistry–Methods
language:en
Short-container-title:Chemistry Methods

Author:

Smilgies Detlef‐M.¹²^ORCID,Koker Margaret K. A.³^ORCID,Li Ruipeng⁴,Shaw Leo⁵^ORCID,Bao Zhenan⁵^ORCID

Affiliation:

1. Materials Science and Engineering Program and Center for Advanced Microelectronics Manufacturing (CAMM) Binghamton University Binghamton NY 13902 USA

2. R. F. Smith School of Chemical and Biomolecular Engineering Cornell University Ithaca NY 14853 USA

3. Department of Physics Lawrence University Appleton WI 54911 USA

4. NSLS-II Brookhaven National Laboratory Upton NY 11973 USA

5. Department of Chemical Engineering Stanford University Stanford CA 94305-4125 USA

Funder

National Science Foundation

Binghamton University

Publisher

Wiley

Subject

Materials Science (miscellaneous)

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/cmtd.202200016

Reference19 articles.

1. Advanced grazing-incidence techniques for modern soft-matter materials analysis

2. GIWAXS-SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing-incidence wide-angle X-ray scattering of organic materials

3. Self-assembled gradient nanoparticle-polymer multilayers investigated by an advanced characterization method: microbeam grazing incidence x-ray scattering

4. Direct Structural Mapping of Organic Field-Effect Transistors Reveals Bottlenecks to Carrier Transport

5. Rational Design of Organic Semiconductors for Texture Control and Self-Patterning on Halogenated Surfaces

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1. X-ray diffraction under grazing incidence conditions;Nature Reviews Methods Primers;2024-02-29