Toward a standard for remote microscope control systems-Reference-Cited by-同舟云学术

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Toward a standard for remote microscope control systems

Published:1998-03 Issue:2 Volume:20 Page:110-116
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Morgan Christopher,Pardoe Don,Smith Nancy

Funder

National Science Foundation

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.1998.4950200209/fullpdf

Reference22 articles.

1. Computer networked scanning electron microscope for teaching, research, and industrial applications;Chumbley;Microsc Res Techn,1995

2. Telemicroscopy;Fan;Ultramicroscopy,1993

3. ISO/IEC JTC1 SC29 1993

4. ISO/IEC JTC1 SC29 Information technology-Digital compression and coding of continuous-tone still images: Requirements and guidelines. 1994

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