Numerical modeling of strain hardening effect on an AFM cantilever undergoing stress in tapping mode
Author:
Affiliation:
1. Mechanical Engineering Complex, Department of Mechanical Engineering University of Ibadan Ibadan Nigeria
Publisher
Wiley
Subject
General Medicine
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/nano.202100047
Reference28 articles.
1. Atomic Force Microscope
2. J.Zhang N.Xi G.Li C. H.Su Proceeding IEEE/RSJ Conference of. Intelligent Robots and Systems Beijing China 2006.
3. Quantitative mechanical characterization of materials at the nanoscale through direct measurement of time-resolved tip–sample interaction forces
4. An atomic force microscope tip designed to measure time-varying nanomechanical forces
5. High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy
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