Impedance Spectroscopy Analysis of Structural Defects in Sputtered ZnO Films-Reference-Cited by-同舟云学术

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Impedance Spectroscopy Analysis of Structural Defects in Sputtered ZnO Films

Published:2020-04-06 Issue:9 Volume:7 Page:2055-2064
ISSN:2196-0216
Container-title:ChemElectroChem
language:en
Short-container-title:ChemElectroChem

Author:

Soares Costa Josiane¹²,Prestat Michel¹^ORCID,Tribollet Bernard³,Lescop Benoit²,Rioual Stéphane²,Holzer Lorenz⁴,Thierry Dominique¹

Affiliation:

1. French Corrosion Institute 220 rue Pierre Rivoalon 29200 Brest France

2. Univ Brest, Lab-STICC CNRS UMR 6285 29200 Brest France.

3. Sorbonne Université, CNRSLaboratoire Interfaces et Systèmes Electrochimiques LISE 75005 Paris France

4. Institute of Computational PhysicsZurich University of Applied Sciences Wildbachstrasse 21 8400 Winterthur Switzerland

Funder

Association Nationale de la Recherche et de la Technologie

Ministère de l'Education Nationale, de l'Enseignement Superieur et de la Recherche

Publisher

Wiley

Subject

Electrochemistry,Catalysis

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/celc.202000087

Reference45 articles.

1. Electrochemical Impedance Spectroscopy

2. Characterization of the porosity of silicon nitride thin layers by Electrochemical Impedance Spectroscopy

3. Anodic oxide films. Part 4.—The interpretation of impedance measurements on oxide coated electrodes on niobium

4. Constant-Phase-Element Behavior Caused by Resistivity Distributions in Films

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