Correlation between ion impurity in thermally activated delayed fluorescence organic light‐emitting diode materials and device lifetime-Reference-Cited by-同舟云学术

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Correlation between ion impurity in thermally activated delayed fluorescence organic light‐emitting diode materials and device lifetime

Published:2020-06-08 Issue:11 Volume:28 Page:905-910
ISSN:1071-0922
Container-title:Journal of the Society for Information Display
language:en
Short-container-title:J Soc Inf Display

Author:

Inoue Masaru¹^ORCID,Oyabu Noriaki²^ORCID,Kaneko Yoshiyuki³,Kim Jun‐Yun⁴,Yang Joong‐Hwan⁵

Affiliation:

1. a2i labs TOYOTech LLC Fremont California USA

2. One Technologies Company TOYO Corp. Tokyo Japan

3. Physics & Chemistry Measurement Division TOYO Corp. Tokyo Japan

4. OC Device Technology Department LG Display Co., Ltd. Seoul Korea

5. Foundation Technology Laboratory LG Display Co., Ltd. Seoul Korea

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jsid.922

Reference15 articles.

1. 8‐1: The Method to Compensate IR‐Drop of AMOLED Display

2. 60‐3: Study on the Efficiency Improvement of OLED TVs with High Transmittance Technology of the Polarizer

3. Highly efficient organic light-emitting diodes from delayed fluorescence

4. 33‐1: Invited Paper: TADF based OLED Devices

5. YangJ.The Progress of TADF Development. Proc. 4thInternational TADF Workshop/2ndi3‐opera Forum.2019;38–39.

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. P‐134: Detection of Ion Impurities in Organic Thin Films by Displacement‐Current Measurement Method;SID Symposium Digest of Technical Papers;2022-06

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