Surface Analysis I. Imaging Surfaces, Electric Charges and Magnetic Domains with the Atomic Force Microscope-Reference-Cited by-同舟云学术

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Surface Analysis I. Imaging Surfaces, Electric Charges and Magnetic Domains with the Atomic Force Microscope

Published:1989-11 Issue:11 Volume:101 Page:1610-1613
ISSN:0044-8249
Container-title:Angewandte Chemie
language:de
Short-container-title:Angew. Chem.

Author:

Rabe Jürgen P.

Publisher

Wiley

Subject

General Medicine

Reference12 articles.

1. Atomic Force Microscope

2. Atomic Resolution with Atomic Force Microscope

3. Forces in atomic force microscopy in air and water

4. Atomic resolution imaging of a nonconductor by atomic force microscopy

5. Imaging Crystals, Polymers, and Processes in Water with the Atomic Force Microscope

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Microscopy of Coatings;Encyclopedia of Analytical Chemistry;2006-09-15

2. Surface analysis V. Scanning probes for surface magnetization;Advanced Materials;1990-12

3. Magnetic force microscopy;Advanced Materials;1990-11

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