Open circuit fault diagnosis of three‐phase inverter based on SR‐WOA‐ELM

Author:

Yao Fang1,Liu Qian2ORCID,Ji Borui1,Zhang Wenyu3,Wu Youxi4,Tang Yu1

Affiliation:

1. State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology Tianjin China

2. State Grid Hebei Shahe Power Supply Co., Ltd Xingtai China

3. State Grid Jibei Zhangjiakou Wind and Solar Energy Storage and Transportation New Energy Co., Ltd Zhangjiakou China

4. School of Artificial Intelligence Hebei University of Technology Tianjin China

Abstract

SummaryTo ensure smooth power exchange in a three‐phase inverter, it is important to accurately detect the faults of insulated gate bipolar transistor (IGBT) switches. However, the fault characteristics of power tubes are complex, the fault diagnosis results are affected by the load, and the recognition accuracy of some fault diagnosis models is low. To tackle this issue, this paper proposes an inverter open circuit fault diagnosis method named SR‐WOA‐ELM, which integrates signal reconstruction (SR), the whale optimization algorithm (WOA), and an extreme learning machine (ELM). First, the three‐phase output current is processed by the signal reconstruction method to eliminate the effect of load fluctuation, the average value of low frequency coefficients and wavelet entropy is extracted from the reconstructed three‐phase currents using the improved wavelet packet transform, and the fault feature vector is constructed by fusing the above two feature parameters. Second, the parameters of the ELM fault diagnosis model are optimized using WOA. Finally, the fault feature vector is added in the SR‐WOA‐ELM model to obtain the fault diagnosis results. Through simulation and experimental verification, the model can accurately identify the single‐tube and double‐tube faults of the inverter and is not affected by load fluctuations.

Funder

Natural Science Foundation of Hebei Province

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

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