1. Anomaly detection for IGBTs using Mahalanobis distance;Patil;Microelectronics Reliability,2015
2. Anomaly detection for insulated gate bipolar transistor (IBGT) under power cycling using principal component analysis and k-nearest neighbor algorithm;Sutrisno;Journal of Washington Academy of Sciences,2012
3. A prognostic approach for non-punch through and field stop IGBTs;Patil;Microelectronics Reliability,2012
4. Patil , N. Menon , S. Das , D. Pecht , M. 2010 Proceedings of the 2nd International Conference on Reliability, Safety and Hazard