The Use of Power Spectrum Density for Surface Characterization of Thin Films-Reference-Cited by-同舟云学术

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The Use of Power Spectrum Density for Surface Characterization of Thin Films

Published:2019-03-25 Issue: Volume: Page:379-411
ISSN:
Container-title:Photoenergy and Thin Film Materials
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Author:

Mwema Fredrick Madaraka¹,Akinlabi Esther Titilayo¹,Oladijo Oluseyi Philip¹,Oladijo Oluseyi Philip²

Affiliation:

1. Department of Mechanical Engineering Science; University of Johannesburg, Auckland Park, Kingsway Campus; Johannesburg South Africa

2. Department of Chemical, Materials and Metallurgical Engineering; Botswana International University of Science and Technology; Palapye Botswana

Publisher

John Wiley & Sons, Inc.

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/9781119580546.ch9/fullpdf

Reference29 articles.

1. Evaluation of Electrical, evaluation of mechanical properties, and surface roughness of dc sputtering nickel-iron thin films;Tien;IEEE Trans. Magn.,2014

2. Effect of surface roughness on nanoindentation test of thin films;Jiang;Eng. Fract. Mech.,2008

3. Measurement of thin film interfacial surface roughness by coherence scanning interferometry;Yoshino;J. Appl. Phys.,2017

4. Alternating Bias., Radio-frequency magnetron sputtering;Rabady;J. Opt. Soc. Am.,2003

5. Quantitative characterisation of surface finishes on stainless steel sheet using 3D surface topography analysis;Waterworth;Thesis (Doctoral),2010

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