Monte Carlo simulation of microparticle motion in vacuum gap-Reference-Cited by-同舟云学术

Monte Carlo simulation of microparticle motion in vacuum gap

Published:2018-12-11 Issue: Volume: Page:
ISSN:0424-7760
Container-title:Electrical Engineering in Japan
language:en
Short-container-title:Electr Eng Jpn

Author:

Ejiri Haruki¹,Kumada Akiko¹,Hidaka Kunihiko¹,Donen Taiki²,Kokura Kentaro²

Affiliation:

1. Graduate School of EngineeringThe University of Tokyo Tokyo Japan

2. Advanced Technology R&D Center Mitsubishi Electric Corp. Amagasaki Japan

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/eej.23174

Reference21 articles.

1. An investigation into major factors in shunt capacitor switching performances by vacuum circuit breakers with copper–chromium contacts;Kamikawaji T;IEEE Trans Power Del,1993

2. Breakdown characteristics under metallic microparticle contaminated conditions in vacuum gap;Shioiri T;Trans IEE Jpn,1993

3. The effect of glass debris on electron emission and electrical breakdown of vacuum interrupters;Farrall GA;IEEE Trans Electr Insul,1980

4. The effect of alumina inclusions on the breakdown and emission properties of copper surfaces in vacuum;Farrall GA;J Appl Phys,1979

5. Calculation of field strength and force acting on conducting sphere in gaps and its application for prediction of gaseous breakdown voltage;Hara M;IEEJ Trans A,1975

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