P‐14.2: 3D Reflectivity Simulation of OLED products through rigorous electromagnetic analysis integrated into Monte Carlo Ray‐tracing solutions

Author:

Zang Dandan1,Cai Yu1,Ge Shucheng1,Yuan Yong1

Affiliation:

1. Wuhan Tianma Microelectronics Co., Ltd Wuhan China

Abstract

We have successfully proposed a 3D reflectivity simulation method for OLED displays applying with CFOT and MLP structures. The simulation method combines the use of EM wave optics and ray tracing tools The reflectivity of simulated and experimental data is in perfect agreement. Meanwhile, the influence of the micro‐lens morphology on reflectivity is studied in detail.

Publisher

Wiley

Reference9 articles.

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