X-ray Topographic Defects' Contrast on Synthetic Quartz-Reference-Cited by-同舟云学术

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X-ray Topographic Defects' Contrast on Synthetic Quartz

Published:1993 Issue:5 Volume:28 Page:615-621
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Cryst. Res. Technol.

Author:

Chirilă R.,Csiki Z.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference17 articles.

1. , : 41st Annual Symp. Freq. Control (1987) 213

2. The effect of impurities on the growth of synthetic quartz∗

3. , : 43rd Annual Symp. Freq. Control (1989) 470

4. : 41st Annual Symp. Freq. Control (1987) 228

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dislocations in synthetic quartz;Crystal Research and Technology;1994

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