Investigation of Crystalline Polymeric Solids at Reduced Beam Damage in the High Voltage Electron Microscope-Reference-Cited by-同舟云学术

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Investigation of Crystalline Polymeric Solids at Reduced Beam Damage in the High Voltage Electron Microscope

Published:1982 Issue:10 Volume:17 Page:1241-1254
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Cryst. Res. Technol.

Author:

Michler G. H.,Dietzsch Ch.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference36 articles.

1. Microstructure of bulk polymers as revealed in ultrathin sections

2. : Proc. 9th Intern. Congr. Electr. Microsc. Toronto, 1978, Vol I, pp 498–499

3. : in: Physical aspects of electron microscopy and microbeam analysis, New York 1975, pp 279–285

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1. Electron Microscopy of Polymers;Polymer Morphology;2016-04-01

2. Influences of Techniques and Methods on Micrographs;Atlas of Polymer Structures;2016

3. Methods and Investigation Techniques;Nano- and Micromechanics of Polymers;2012

4. Electron microscopic investigations of morphology and structure formation of polymers;Journal of Macromolecular Science, Part B;1996-06

5. Electron Microscopy in Polymer Science;Applied Spectroscopy Reviews;1993-12

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