X-ray characterization of prepared Cd(Te, Se) surfaces-Reference-Cited by-同舟云学术

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X-ray characterization of prepared Cd(Te, Se) surfaces

Published:1987-05 Issue:5 Volume:22 Page:K86-K87
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Cryst. Res. Technol.

Author:

Sassenberg U.,Berger H.,Engel A.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference2 articles.

1. Structural Characterization of Cut and Polished PbTe Surfaces

2. MBE growth of CdTe, Hg1−xCdxTe, and multilayer structures: Achievements, problems, and prospects

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Crystal Growth and Surfaces;CdTe and Related Compounds; Physics, Defects, Hetero- and Nano-structures, Crystal Growth, Surfaces and Applications;2010

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