X-ray and scanning cathodoluminescence imaging of small-angle grain boundaries and dislocations in CdTe crystals
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference3 articles.
1. : X-ray methods in the study of defects in single crystals, New York, Oxford 1967
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Study of Precipitate‐like Defects in CdTe Crystals;Journal of The Electrochemical Society;1995-09-01
2. Panchromatic cathodoluminescence investigation of defects in CdTe bulk crystals and homoepitaxial layers;Applied Physics Letters;1994-12-19
3. Spatial origin of various PL lines in CdTe at 77 K;Journal of Crystal Growth;1988-01
4. Sub-grain boundaries in CdxHg1−xTe and CdTe;Journal of Crystal Growth;1987-06
5. Cathodoluminescence of HgCdTe and CdTe on CdTe and sapphire;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1985-01
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