The Failure Mechanism of Recrystallization-Assisted Cracking of Solder Interconnections

Author:

Mattila Toni T.

Publisher

John Wiley & Sons, Inc.

Reference53 articles.

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2. Thermomechanical reliability characterization of a handheld product in accelerated tests and use environment;Karppine;Microelectronics Reliability,2010

3. IEC 60068-2-14 Ed. 5.0 b: 1984, “Environmental testing - part 2: tests. Test N: change of temperature,” International Electrotechnical Commission, (1984), 34 p

4. JESD22-A104C, “Temperature Cycling,” Jedec Solid State Technology Association , (2005), 16 p

5. IPC-TM-650 rev. A, “Thermal Shock and Continuity, Printed Board,” The Institute for Interconnecting and Packaging Electronic Circuits , (1997), 2 p

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