Tangential Homology for Defect Detection in the Time of Flight Diffraction Method (TOFD)

Author:

Cuenca Jose F.,Iske Armin,Labud Patrick A.,Nemitz Oliver

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Reference3 articles.

1. A. Collins A. Zomorodian G. Carlsson L.J. Guibas A barcode shape descriptor for curve point cloud data. Computers and Graphics 28(6), 2004, 881-894.

2. J.F. Cuenca A. Iske Persistent homology for defect detection in non-destructive evaluation of materials. The e-Journal of Nondestructive Testing, vol. 21, no. 01, January 2016, ISSN 1435-4934.

3. F. Bossmann Model Based Defect Reconstruction in Ultrasonic Non-Destructive Testing. PhD thesis, University of Göttingen, 2013.

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