Another century of ellipsometry *

Author:

Schubert M.12

Affiliation:

1. Department of Electrical Engineering and Center for Materials Research and Analysis, 209N Walter Scott Engineering Center, University of Nebraska‐Lincoln, Lincoln NE 68588‐0511, USA

2. Universität Leipzig, Fakultät für Physik und Geowissenschaften, Institut für Experimentelle Physik II, Linnéstrasse 5, 04103 Leipzig, Germany

Publisher

Wiley

Subject

General Physics and Astronomy

Reference83 articles.

1. A.Rothen in: Ellipsometry in the Measurement of Surfaces and Thin Films edited by E. Passaglia R. R. Stromberg and J. Krüger (National Bureau of Standards Miscellaneous Publications Washington D.C. 1963) pp. 7–24.

2. A.C.Hall in: Recent Developments in Ellipsometry edited by N. M. Bashara A. B. Buckman and A. C. Hall (North‐Holland Publishing Company Amsterdam 1969) pp. 1–13.

3. R.M.A.Azzam in: Ellipsometry edited by N. M. Bashara and R. M. A. Azzam (North‐Holland Publishing Company Amsterdam 1976) pp. 6–18.

4. A.Vašiček in: Selected Papers on Ellipsometry edited by R. M. A. Azzam (SPIE Milestone Series Vol. MS27 Bellingham Washington 1990).

5. Ueber die Gesetze der Reflexion und Brechung des Lichtes an der Grenze absorbirender Krystalle

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