XPS study of BN thin films deposited by CVD on SiC plane substrates-Reference-Cited by-同舟云学术

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XPS study of BN thin films deposited by CVD on SiC plane substrates

Published:1990-07 Issue:1-12 Volume:16 Page:440-445
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Guimon C.,Gonbeau D.,Pfister-Guillouzo G.,Dugne O.,Guette A.,Naslain R.,Lahaye M.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference51 articles.

1. Cubic Form of Boron Nitride

2. An X-ray study of boron nitride

3. Studies in Graphite and Related Compounds I: Electronic Band Structure in Graphite

4. and Fasocie prevrashchemiya v uglerode i nitride bora. Naukova Dumka, Kiev (1979).

5. Turbostratic1 Boron Nitride, Thermal Transformation to Ordered-layer-lattice Boron Nitride

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