Charge stabilization and ion trapping under specimen isolation conditions during Sims analysis-Reference-Cited by-同舟云学术

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Charge stabilization and ion trapping under specimen isolation conditions during Sims analysis

Published:1992-04 Issue:4 Volume:18 Page:262-268
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

van der Heide P. A. W.,Metson J. B.,Lau W. M.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference15 articles.

1. and Secondary Ion Mass Spectrometry. Wiley, New York (1989).

2. Trace element analysis with the ion probe

3. Computer program for peak identification in secondary ion mass spectra

4. Applications of the Ion Microprobe to Geochemistry and Cosmochemistry

5. Analysis of insulating specimens with the Cameca IMS4f

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1. Negative ion beam bombardment of a protic ionic liquid: Alleviating surface charging and damage and analyzing the surface of organic insulating materials;Journal of Vacuum Science & Technology A;2022-09

2. SIMS analysis of lead isotope composition in ancient Chinese metallic artefacts;Surface and Interface Analysis;2000

3. SIMS imaging of insulator surfaces;Surface and Interface Analysis;1993-11

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