Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference3 articles.
1. Proc. Semicond, Internat. '86 (Publ. Cahners) pp 213-223 (1986).
2. In situ monitoring during ion beam processing of multi-layer epitaxial III-V device structures
3. ‘Monitoring MQW layer structures…’ To be submitted for publication.
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