Nitridation of polycrystalline titanium as studied byin situ angle-resolved x-ray photoelectron spectroscopy-Reference-Cited by-同舟云学术

Nitridation of polycrystalline titanium as studied byin situ angle-resolved x-ray photoelectron spectroscopy

Published:1988-08 Issue:11 Volume:11 Page:563-568
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Ermolieff A.,Bernard P.,Marthon S.,Wittmer P.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference27 articles.

1. Extended Abstract—Spring Meeting Electrochemical Society, May 1983, San Francisco, California, ed. by the Electrochemical Society, Vol. 83-1, p. 569.

2. Silicides for VLSI Applications, Academic Press, N.Y. (1983).

3. LETI/MSC, Compte rendu DAII, Grenoble (1986).

4. Photoemission energy level measurements of sorbed gases on titanium

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