The NIST x-ray photoelectron spectroscopy database

Author:

Rumble J. R.,Bickham D. M.,Powell C. J.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference8 articles.

1. Formal databases for surface analysis: The current situation and future trends

2. The NIST X-ray Photoelectron Spectroscopy Database, NIST Technical Note Number 1289. US Department of Commerce, Gaithersburg, MD (1991).

3. A new approach to identifying chemical states, comprising combined use of Auger and photoelectron lines

4. Nomenclature of Inorganic Chemistry, Butterworths, London (1971);

5. Nomenclature of Organic Chemistry, Pergamon, Oxford (1979).

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