Adhesion of copper and chromium films to polyimide studied by static SIMS of the interface-Reference-Cited by-同舟云学术

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Adhesion of copper and chromium films to polyimide studied by static SIMS of the interface

Published:1988-07 Issue:9 Volume:12 Page:505-506
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

van Ooij W. J.,Brinkhuis R. H. G.,Park J. M.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference4 articles.

1. and submitted to Surf. Interface Anal.

2. and in preparation for publication in Surf. Interface Anal.

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Combined ToF-SIMS/XPS study of plasma modification and metallization of polyimide;SURF INTERFACE ANAL;1999

2. Combined ToF‐SIMS/XPS study of plasma modification and metallization of polyimide;Surface and Interface Analysis;1999-07

3. Physical and chemical properties of the chromium/polyphenylquinoxaline interface;Journal of Applied Physics;1998-06-15

4. Factors Affecting Adhesion at Copper-Polyamide 11 and Aluminum-Polyamide 11 Interfaces;Journal of Thermoplastic Composite Materials;1997-09

5. Studies of adhesion by secondary ion mass spectrometry;IBM Journal of Research and Development;1994-07

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