Quantitative surface analysis of layered materials
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference35 articles.
1. in Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy, ed. by and p. 181. Wiley, Chichester (1983).
2. and Fundamentals of Surface and Thin Film Analysis. North-Holland, New York (1986).
3. Quantification and measurement by Auger electron spectroscopy and X-ray photoelectron spectroscopy
4. Precision, accuracy, and uncertainty in quantitative surface analyses by Auger‐electron spectroscopy and x‐ray photoelectron spectroscopy
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