Composition of natural oxide films on polycrystalline tantalum using XPS electron take-off angle experiments
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference6 articles.
1. AES sputter profiling and angle resolved XPS ofin situ grown very thin Tantalum-oxide films
2. Thickness of natural oxide films determined by AES and XPS with/without sputtering
3. Auger electron spectroscopy investigations of the oxide-metal interface between anodic Ta2O5 layers and polycrystalline tantalum
4. Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
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