Comparison of Auger and SIMS analysis of a thin passive oxide film on iron—25% chromium-Reference-Cited by-同舟云学术

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Comparison of Auger and SIMS analysis of a thin passive oxide film on iron—25% chromium

Published:1987-06 Issue:5 Volume:10 Page:259-261
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Mitchell D. F.,Graham M. J.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference7 articles.

1. Nature of passive films on Fe26Cr alloy

2. Quantitative analysis of iron oxides using Auger electron spectroscopy combined with ion sputtering

3. and Handbook of Auger Electron Spectroscopy, 2nd Edition, Physical Electronics Industries Inc., Eden Prairie, MN (1976).

4. Quantitative interpretation of Auger sputter profiles of thin layers

5. A simple model for the dependence of Auger intensities on specimen thickness

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