A new approach for curve-resolving photoemission peaks in XPS
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference13 articles.
1. Data analysis techniques in x-ray photoelectron spectroscopy
2. Quantitative analysis of the inelastic background in surface electron spectroscopy
3. The analytical form of the Shirley-type background
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