1. For a review of XPS see: and in Methods of Surface Analysis Vol 1, ed. by Elsevier (1975).
2. X‐ray photoelectron and Auger analysis of thin films
3. Characterization of VLSI materials
4. Surface Science Laboratories Inc., Mountain View, CA 94043, USA.
5. Leybold-Heraeus Vacuum Products, Thirty Second National Symposium of the American Vacuum Society, Houston, Nov. 19-22 (1985).