An XPS analysis of different SiO2 modifications employing a C 1s as well as an Au 4f7/2 static charge reference-Reference-Cited by-同舟云学术

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An XPS analysis of different SiO2 modifications employing a C 1s as well as an Au 4f7/2 static charge reference

Published:1992-01 Issue:1 Volume:18 Page:59-64
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Gross Th.,Ramm M.,Sonntag H.,Unger W.,Weijers H. M.,Adem E. H.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference27 articles.

1. A method for depositing well defined metal particles onto a solid sample suitable for static charge referencing in X-ray photoelectron spectroscopy

2. in Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, ed. by and Chapt. 8, pp. 283-358. Wiley, Chichester (1983).

3. Models for the oxidation of silicon

4. Silicalite, a new hydrophobic crystalline silica molecular sieve

5. Extinction in quartz

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