Automated interface recognition in auger sputter depth profiling
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
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Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Generation of the Al(111) Surface Defects under Influence of Low-Energy Ar$^{+}$ Ions;METALLOFIZIKA I NOVEISHIE TEKHNOLOGII;2016-09-06
2. LEED study of Ni (100) and (111) surface damage caused by Ar+ ion bombardment with low energy and small doses;Vacuum;2000-04
3. Ion-selective electrodes;Analytical Chemistry;1990-06-15
4. Depth Profiling Using Sputtering Methods;Methods of Surface Characterization
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