The determination of uncertainties in quantitative XPS/AES and its impact on data acquisition strategy
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference12 articles.
1. Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis
2. Quantitative AES: The establishment of a standard reference spectrum for the accurate determination of spectrometer transmission functions
3. A model for determining the composition of layer structured samples using XPS electron take-off angle experiments
4. Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesis
5. Random uncertainties in AES and XPS: II: Quantification using either relative or absolute measurements
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