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4. and Evaluation and optimization of the performance of elastic and inelastic STEM imaging by correlation analysis', to be published in Proc. of 6th Pfefferkorn conference, Niagara Falls (1987); and C. Colliex, Recent advances in submicron analysis with EELS and EDX spectroscopies in the electron microscope', to be published in Proc. of the 5th Conference on Festkörperanalytik, Karl Marx Stadt (1987).