NESSPIOM?Network for enhanced semiconductor surface processing throughin situ optical monitoring
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference36 articles.
1. Above-bandgap optical anisotropies in cubic semiconductors: A visible–near ultraviolet probe of surfaces
2. Metalorganic vapour phase epitaxial growth on vicinal GaAs (001) surfaces studied by reflectance anisotropy spectroscopy
3. Investigation of the relationship between reflectance difference spectroscopy and surface structure using grazing incidence X-ray scattering
4. Optical characterization of surfaces during epitaxial growth using RDS and GIXS
5. LINEAR OPTICAL SPECTROSCOPIES FOR SURFACE STUDIES
Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Optical characterization techniques for process monitoring;Surface and Interface Analysis;2001
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