Surface Analysis and Ultra-Shallow Molecular Depth-Profiling of Polyethylene Treated by an Atmospheric Ar-D2O Post-Discharge-Reference-Cited by-同舟云学术

Surface Analysis and Ultra-Shallow Molecular Depth-Profiling of Polyethylene Treated by an Atmospheric Ar-D2O Post-Discharge

Published:2015-05-13 Issue:9 Volume:12 Page:919-925
ISSN:1612-8850
Container-title:Plasma Processes and Polymers
language:en
Short-container-title:Plasma Process. Polym.

Author:

Cristaudo Vanina¹,Collette Stéphanie²,Poleunis Claude¹,Reniers François²,Delcorte Arnaud¹

Affiliation:

1. Institut de la Matière Condensée et des Nanosciences (IMCN); Bio & Soft Matter (BSMA); Université catholique de Louvain (UCL); 1 Croix du Sud box L7.04.01 B-1348 Louvain-la-Neuve Belgium

2. Chimie Analytique et Chimie des Interfaces (CHANI); CP 255; Université Libre de Bruxelles (ULB); 2 Boulevard du Triomphe B-1050 Brussels Belgium

Publisher

Wiley

Subject

Polymers and Plastics,Condensed Matter Physics

Reference34 articles.

1. Chemical and morphological modification of polymers under a helium–oxygen dielectric barrier discharge

2. Comparative study on the effect of RF and DBD plasma treatment on PTFE surface modification

3. H2O plasma modification of track-etched polymer membranes for increased wettability and improved performance

4. In-depth diffusion of oxygen into LDPE exposed to an Ar-O2 atmospheric post-discharge: a complementary approach between AR-XPS and Tof-SIMS techniques

5. Plasma-modified polymer surfaces: Characterization using XPS

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