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A compact model for dielectric charging in RF MEMS capacitive switches

  • Published:2009-03 Issue:2 Volume:19 Page:197-203
  • ISSN:1096-4290
  • Container-title:International Journal of RF and Microwave Computer-Aided Engineering
  • language:en
  • Short-container-title:Int J RF and Microwave Comp Aid Eng

Author:

Sumant Prasad S.,Aluru Narayana R.,Cangellaris Andreas C.

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Reference13 articles.

1. Lifetime characterization of capacitive RF MEMS switches;Goldsmith;IEEE MTT-S Int Microwave Symp Dig,2001

2. Initial observation and analysis of dielectric charging effects on RF MEMS capacitive switches;Yuan;IEEE MTT-S Int Microwave Symp Dig,2004

3. Modeling and characterization of dielectric charging effects in RF MEMS capacitive switches;Yuan;IEEE MTT-S Int Microwave Symp Dig,2005

4. Reliability modeling of capacitive RF MEMS;Melle;IEEE Trans Microwave Theory Tech,2005

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