Divulging the Potential of Sodium Carbide Thin Film for Semiconductor Applications

Abstract

The work reported in this article is an attempt to introduce the least explored sodium carbide as a thin film and to explore its semiconducting behavior. The sodium carbide thin film deposited by the radio frequency sputtering technique is subjected to morphology, structure, and spectroscopic characterizations. The floral petal‐like morphology, understood from the field‐emission scanning electron microscopy and atomic force microscopy images, helps in enhancing interaction with the radiation that is revealed through the UV–visible absorption spectrum. X‐ray diffraction, photoelectron and Raman spectroscopic analyses confirm that the film is sodium carbide. The optical emission behavior of the sodium carbide thin film in the blue region is unveiled through the photoluminescence spectrum, power spectrum, color purity, and chromaticity diagram. Employing the refractive index and extinction coefficient values from the specular reflectance data, optical and electrical conductivities, nonlinear refractive index, linear and nonlinear optical susceptibility, dissipation factor, and surface and volume energy loss functions and their wavelength dependence due to interfacial polarization are investigated. The transfer matrix method is used to understand the spatial variation of the induced electric field and optical current density.