Extracting the dielectric function from high‐energy REELS measurements-Reference-Cited by-同舟云学术

Extracting the dielectric function from high‐energy REELS measurements

Published:2017-03-22 Issue:9 Volume:49 Page:809-821
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Vos Maarten¹^ORCID,Grande Pedro L.²

Affiliation:

1. Electronic Materials Engineering Department, Research School of Physics and Engineering The Australian National University Canberra 2601 Australia

2. Ion Implantation Laboratory, Instituto de Física Universidade Federal do Rio Grande do Sul Av. Bento Goncalves, 9500, CP 15051 Porto Alegre CEP 91501‐970 RS Brazil

Funder

Australian Research Council

Conselho Nacional de Desenvolvimento Científico e Tecnológico

Instituto Nacional de Ciência e Tecnologia para Engenharia de Software

Fundação de Amparo à Pesquisa do Estado do Rio Grande do Sul

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6227

Reference46 articles.

1. Plasma Losses by Fast Electrons in Thin Films

2. Differential inelastic electron scattering cross sections from experimental reflection electron-energy-loss spectra: Application to background removal in electron spectroscopy

3. Quantitative analysis of reflection electron energy-loss spectra

4. Differential cross sections for plasmon excitations and reflected electron-energy-loss spectra

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