P‐226: Late‐News‐Poster: Degradation and Impurity Analysis of Organic Materials for OLED Application by Laser Desorption/Ionization Time of Flight‐Mass Spectrometry-Reference-Cited by-同舟云学术

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P‐226: Late‐News‐Poster: Degradation and Impurity Analysis of Organic Materials for OLED Application by Laser Desorption/Ionization Time of Flight‐Mass Spectrometry

Published:2020-08 Issue:1 Volume:51 Page:2093-2095
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:SID Symposium Digest of Technical Papers

Author:

Oh Yoonseok¹,Shin Dongjin¹,Oh Jooyeon¹,Kim Yangsun¹,Moon Hyunsoo²,Park Man Jae²,Ahn Nari²,Lee Chan-jae³

Affiliation:

1. ASTA, Inc. 660, Daewangpangyo-ro, Bundang-gu, Seongnam-si Gyeonggi-do Korea

2. Samsung Display Co., Ltd. 181, Samsung-ro, Tangjeong-myeon, Asan-si Chungcheongnam-do Korea

3. Korea Electronics Technology Institute 25, Saenari-ro, Bundang-gu, Seongnam-si Gyeonggi-do Korea

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.14334

Reference3 articles.

1. Operational degradation of organic light-emitting diodes: Mechanism and identification of chemical products;Kondakov D;Journal of Applied Physics,2007

2. Investigation of FIrpic in PhOLEDs via LC/MS technique;Sivasubramaniam V;Open Chemistry,2009

3. Dynamic SIMS characterization of interface structure of Ag/Alq3/NPB/ITO model devices

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. P‐101: Degradation Analysis of OLED Panels by Laser Desorption/Ionization Time‐of‐Flight Mass Spectrometry with Fine‐Focused Imaging System;SID Symposium Digest of Technical Papers;2021-05

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