Temperature‐dependency analysis and correction methods of in situ power‐loss estimation for crystalline silicon modules undergoing potential‐induced degradation stress testing-Reference-Cited by-同舟云学术

Temperature‐dependency analysis and correction methods of in situ power‐loss estimation for crystalline silicon modules undergoing potential‐induced degradation stress testing

Published:2015-01-21 Issue:11 Volume:23 Page:1536-1549
ISSN:1062-7995
Container-title:Progress in Photovoltaics: Research and Applications
language:en
Short-container-title:Prog. Photovolt: Res. Appl.

Author:

Spataru Sergiu¹^ORCID,Hacke Peter²,Sera Dezso¹,Packard Corinne²³,Kerekes Tamas¹,Teodorescu Remus¹

Affiliation:

1. Energy Technology Aalborg University Aalborg Denmark

2. National Renewable Energy Laboratory Golden CO USA

3. Metallurgical and Materials Engineering Colorado School of Mines Golden CO USA

Funder

U.S. Department of Energy

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pip.2587

Reference34 articles.

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3. HackeP TerwilligerK KurtzS.In‐situ measurement of crystalline silicon modules undergoing potential‐induced degradation in damp heat stress testing for estimation of low‐light power performance.2013 National Renewable Energy Laboratory (NREL) Golden CO. p. 1‐10. Report NREL/TP‐5200‐60044. DOI:10.2172/1090973

4. PingelS FrankO WinklerM DaryanS GeipelT HoehneH BergholdJ. Potential induced degradation of solar cells and panels. in35th IEEE Photovoltaic Specialists Conference.2010. Honolulu Hawaii. DOI:10.1109/PVSC.2010.5616823

5. NagelH MetzA WangemannK. Crystalline Si solar cells and modules featuring excellent stability against potential‐induced degradation. in26th European Photovoltaic Solar Energy Conference and Exhibition.2011. Hamburg Germany. DOI:10.4229/26thEUPVSEC2011-4CO.5.6

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